Support | Code | |
---|---|---|
Precise Level CalibrationIncrease the reliability and accuracy of voltage and current | ||
CX1000 Calibration Certificate(For customers in Japan) CX1000 Calibration Certificate | ||
CX1000P Calibration FeesCX1000P Calibration Fees | ||
CX1000D Calibration FeesCX1000D Calibration Fees | ||
Basic SupportSupport the basic usage of CloudTesting(TM) Service. | ||
Standard Support(annual license)Support the concrete problems and issues on the measurement and the evaluation timely(with calibration service). | ||
Standard Support(spot)Support the concrete problems and issues on the measurement and the evaluation timely. | ||
F.V.D(Flexible Value Development) ServiceThe turnkey service for the designing of the measurement circuit ,the measurement program creation and the set-up of the environment, etc. | ||
CX1000 Calibration Certificate (soft copy)(For customers in regions except Japan) Calibration Certificate (soft copy) | ||
Cable | Code | |
CX1000D S2-LINK Cable SetConstruct CX1000D S2-LINK configuration by connecting two CX1000D | ||
CTS CONT Cable(1.0m)CTS CONT Cable(1.0m) is a cable to connect CX1000 and your measuring jig. | ||
CTS FUNC Cable(1.0m)CTS FUNC Cable(1.0m) is a cable to connect CX1000 and your measuring jig. | ||
Board | Code | |
CX1000 DC Calibration Board SetIncrease the reliability and accuracy of voltage and current | ||
CloudTesting™ Lab | Code | |
CloudTesting™ Station CX1000PCloudTesting™ Station CX1000P is a measurement instrument for measuring and analyzing the semiconductor device. | ||
CloudTesting™ Station CX1000DCloudTesting™ Station CX1000D is a measurement instrument for measuring and analyzing the semiconductor device. | ||
CloudTesting™ LabCloudTesting™ Lab is software that measures and analyzes by controlling CloudTesting™ Station. | ||
CloudTesting™ Lab CX1000P LicenseMeasure and Analysis with CX1000P | ||
CloudTesting™ Lab CX1000D LicenseMeasure and Analysis with CX1000D | ||
CloudTesting™ Lab CX1000D S2-LINK LicenseMeasure and Analysis with CX1000D S2-LINK Configuration | ||
CloudTesting™ Lab Expert Mode LicenseThis is license for the Expert Mode in which advanced functions of CloudTesting(TM) are available. | ||
CloudTesting™ Lab Pin Multiplex LicenseThis is the license for the Pin Multiplex function. This feature enables measurement over 100Mbps. | ||
Device Program | Code | |
Serial NOR Flash Memory Application PackageSerial NOR Flash Memory Application Package is a package that includes the followings: | ||
Package | Code | |
Logic Test Package (CX1000P)Logic Test Package (CX1000P) is a package product that gathers the IP necessary for evaluating and analyzing logic devices. | ||
Microcontroller Test Package (CX1000P)Microcontroller Test Package (CX1000P) is a package product containing all IP(s) to evaluate/analyze microcontroller devices. | ||
Linear Sensor Test Package (CX1000P)Linear Sensor Test Package (CX1000P) is a package product containing all IP(s) to evaluate/analyze linear and sensor devices. | ||
Professional Package (CX1000P)Professional Package (CX1000P) is a package product containing all the various measurement solutions possessed by CloudTesting(TM) Service. | ||
Logic Test Package (CX1000D)Logic Test Package (CX1000D) is a package product that gathers the IP necessary for evaluating and analyzing logic devices. | ||
Microcontroller Test Package (CX1000D)Microcontroller Test Package (CX1000D) is a package product containing all IP(s) to evaluate/analyze microcontroller devices. | ||
Linear Sensor Test Package (CX1000D)Linear Sensor Test Package (CX1000D) is a package product containing all IP(s) to evaluate/analyze linear and sensor devices. | ||
Professional Package (CX1000D)Professional Package (CX1000D) is a package product containing all the various measurement solutions possessed by CloudTesting(TM) Service. | ||
Logic Test Package (CX1000D S2-LINK)Logic Test Package (CX1000D S2-LINK) is a package product that gathers the IP necessary for evaluating and analyzing logic devices. | ||
Microcontroller Test Package (CX1000D S2-LINK)Microcontroller Test Package (CX1000D S2-LINK) is a package product containing all IP(s) to evaluate/analyze microcontroller devices. | ||
Linear Sensor Test Package (CX1000D S2-LINK)Linear Sensor Test Package (CX1000D S2-LINK) is a package product containing all IP(s) to evaluate/analyze linear and sensor devices. | ||
Professional Package (CX1000D S2-LINK)Professional Package (CX1000D S2-LINK) is a package product containing all the various measurement solutions possessed by CloudTesting(TM) Service. | ||
Memory IC Sorting Package (CX1000P)Memory IC sorting package (CX1000P) is a package product containing IPs necessary for GO-NO-GO test of memory IC used for small-scale production test and incoming inspection test. | ||
Memory IC Evaluation Package (CX1000P)Memory IC Evaluation Package (CX1000P) is a package product that gathers the IP necessary for evaluating and analyzing Memory ICs. | ||
Memory IC Sorting Package (CX1000D)Memory IC sorting package (CX1000D) is a package product containing IPs necessary for GO-NO-GO test of memory IC used for small-scale production test and incoming inspection test. | ||
Memory IC Evaluation Package (CX1000D)Memory IC Evaluation Package (CX1000D) is a package product that gathers the IP necessary for evaluating and analyzing Memory ICs. | ||
Algorithm IP | Code | |
Trigger Generation IPTrigger Generation IP is an algorithm IP that generates a trigger signal for connecting CX1000 to a fault analysis instrument or an external measuring instrument. This IP repeatedly executes the pattern and generates a trigger signal. | ||
Functional Testing for Memory (FunctionalMeasure_Mem_TypeF_IP)Verify the operation of memory function. | ||
Current and Voltage Measurements for Memory (DCParametricMeasure_Mem_TypeF_IP)Measure current and voltage of I/O pins | ||
Power Supply Current Measurement for Memory (PowerSupplyCurrentMeasure_Mem_TypeF_IP)Power Supply Current Measurement for Memory can measure easily power supply current for memory ICs. | ||
Condition Table Memory_TypeF LicenseThe license allows to execute measurement while changing the measurement condition. | ||
Output Raw Fail Address for Memory_TypeF LicenseThe license allows to save Fail Address Data to a file. | ||
High Resolution Timing Setting for Memory_TypeF LicenseThe license allows to sets the timing edge by high resolution of 78.12 ps to Functional Testing for Memory. | ||
Timing Search for Memory_TypeF LicenseAvailable to evaluate and analyze AC characteristics. | ||
Initialization IPInitialization IP is an algorithm IP that initializes variables and system. | ||
Functional Testing IPFunctional Testing IP is an algorithm IP that verifies the logical functions of the IC work correctly. | ||
DC Parametric Measure IPDC Parametric Measure IP is an algorithm IP to measure voltage and current of I/O, RVS, AWG and DGT pins. | ||
Power Supply Current Measure IPPower Supply Current Measure IP is an algorithm IP to measure power supply current. | ||
Condition Setting IPCondition Setting IP is an algorithm IP for setting the device under test and the measurement jig to the specified state. | ||
Frequency Measure IPFrequency Measure IP is an algorithm IP that measures frequency and period of the periodic signal by the frequency counter. | ||
Relay ControlControl CW signal | ||
Batch File Execution IPBatch File Execution IP is an algorithm IP to execute a batch file. | ||
GPIB Control IPGPIB Control IP is an algorithm IP that controls external devices from CloudTesting™ Lab using GPIB I/F. This IP has the function of handling service request from the external device. | ||
Comment Output IPComment Output IP is an algorithm IP that displays arbitrary character strings which were inputted in comment field, to message display area. | ||
Value Judgement IPJudge the result by the specified variable | ||
Generic Search IPGeneric Search IP is an algorithm IP that evaluates various characteristics by executing a measurement item that use any algorithm IP. | ||
Measure Item Execution IPMeasure Item Execution IP is an algorithm IP to execute the target measurement item by combining the measurement item for pre-processing and the measurement item for post-processing. | ||
Peltier Thermal Controller Setting IPPeltier Thermal Controller Setting IP controls Compact Thermal System (CTS-02A) made by ATE Service Corporation. | ||
GPIB External Instrument Measure IPGPIB External Instrument Measure IP is an algorithm IP that controls and measures with external devices using GPIB I/F. | ||
Measurement facilitation by General I/F(I2C) package IPRead and write the register value via I2C interface. | ||
Analog Output Verification IPAnalog Output Verification IP is an algorithm IP that measures the voltage output from measurement target in sync with a pattern. Use Digitizer for capture. | ||
Digital Output Capture IPDigital Output Capture IP is an algorithm IP that captures a signal output from a measurement target as 0/1 data. | ||
ADC DC Linearity MeasurementMeasure DC linearity characteristics of ADC | ||
DAC DC Linearity MeasurementMeasure DC linearity characteristics of DAC | ||
Pattern Modify IPPattern Modify IP is an algorithm IP that modifies the waveform characters (input pattern and expected pattern) in the pattern memory of CX1000. | ||
Fixture Delay Calibration IPFixture Delay Calibration IP is an algorithm IP that compensates the signal transmission path delay within the test fixture. | ||
Fixture Delay Measurement IPFixture Delay Measurement IP is an algorithm IP that measures the signal transmission path delay within the test fixture. | ||
External Power Supply Control PluginExternal Power Supply Control Plugin adds the function which controls external power supplies to algorithm IPs. | ||
Arbitrary Waveform Applying PluginArbitrary Waveform Applying Plugin is a plug-in that adds the function of applying arbitrary waveform synchronized with pattern to measurement object to algorithm IPs. | ||
Data log extension plugin for Functional Testing IPDisplay over 2048 cycles in data log | ||
High resolution timing setting plugin for Functional Testing IPFunction Testing with 250ps timing edge resolution | ||
Multiple Pattern Execution Plugin for Functional Testing IPMultiple Pattern Execution Plugin for Functional Testing IP is a plugin to enable the feature of Functional Testing IP which executes multiple patterns. | ||
Batch File Execution PluginBatch File Execution Plugin adds the function that executes the batch file at specified timing of the measurement sequence to algorithm IPs. | ||
Simultaneous Measurement Function Plugin for DC Parametric Measure IPThis plugin to enable the feature of DC Parametric Measure IP which measures in parallel using multiple DC parametric measurement units. | ||
Multipoint Measurement PluginMultipoint Measurement Plugin adds the function which measures by multiple pattern execution conditions in one test item to algorithm IPs. | ||
Capture Range Extension Plugin for Digital Output Capture IPCapture Range Extension Plugin for Digital Output Capture IP is a plugin which adds the function to extend capture range. | ||
Two Step Search Plugin for Generic Search IPTwo Step Search Plugin for Generic Search IP adds the two step search function which searching with two resolution and search method. By the two step search, you can optimize the measurement time and resolution. | ||
[Discontinued]Ground Pin Contact CheckVerify the connection of ground pin and I/O channel | ||
[Discontinued]Power Supply Pin Contact CheckVerify the connection of power supply pin power supply channel | ||
[Discontinued]Power Supply Current Measure(IDDQ) IPMeasure power supply current on several points of the pattern when the logic circuit is running | ||
[Discontinued]Timing Parameter SearchSearch the timing conditions of the functional test result changing point | ||
[Discontinued]Voltage Parameter SearchSearch the input voltage and compare voltage of the functional test result changing point. | ||
[Discontinued]Schmitt Trigger MeasurementMeasure characteristics of schmitt trigger input pins | ||
[Discontinued]Match Cycle Count MeasurementMeasure the time until the output value becomes expected value after the specified pattern address | ||
[Discontinued]ADC AC Characteristics Measurement IPMeasure AC characteristics(Output code Amplitude, SNR, THD, SFDR, SINAD, ENOB) of ADC | ||
[Discontinued]DAC AC Characteristics MeasurementMeasure AC characteristics(Output code Amplitude, THD, SNR, THD, SFDR) of DAC | ||
[Discontinued]I/O pin capacitance measure IPI/O pin capacitance measure IP is a algorithm IP to measure the capacitance between the signal line and the ground. | ||
[Discontinued]Operating Power Supply Voltage Search IPSearch the power supply voltage of the functional test result changing point | ||
[Discontinued]Pattern Synchronized Voltage Measure IP with NI PXI-5124Measure analog signal voltage by NI PXI-5124 | ||
Analysis IP | Code | |
Shmoo AlgorithmThis is an analysis tool used for characteristic evaluation. | ||
Shmoo Plot ToolShmoo Plot Tool is a analysis IP to perform the measurement item while changing the measurement conditions according to Shmoo conditions. | ||
Pattern Viewer ToolPattern Viewer Tool is an analysis IP which displays the execution result of the pattern program in tabular form. The execution result of the pattern program can be checked effectively. | ||
Pattern Edit Addon for Pattern Viewer ToolEnable the feature of Pattern Viewer tool to modify the pattern | ||
System Condition Monitor ToolSystem Condition Monitor Tool is a analysis IP to check the configuration of CloudTesting™ Station. | ||
Logic Analyzer ToolLogic Analyzer Tool is a analysis IP to display the result of the pattern program in the logic waveform. The behavior of the logic circuit, such as a calculator or interface circuit is displayed visually. | ||
Oscilloscope ToolDisplay the output signal as waveform | ||
Multi Display and Layer Addon for Oscilloscope ToolSample multiple I/O pins and Overlay multiple waveform | ||
Waveform Viewer ToolDisplay the measurement result as a waveform | ||
Multi Display and Layer Addon for Waveform Viewer ToolMulti Display and Layer Addon for Waveform Viewer Tool | ||
Shmoo Plot Tool for MemoryShmoo Plot Tool for Memory is a analysis IP and measure algorithm to perform the measurement item while changing the measurement conditions according to Shmoo conditions. | ||
Fail Bit Map Tool for MemoryDisplay the result of functional test as 2D map | ||
System Condition Monitor Tool for MemoryCheck the configuration of CloudTesting™ Station | ||
Logic Analyzer Tool for MemoryLogic Analyzer Tool for Memory is a analysis IP to display the result of the pattern program in the logic waveform. The behavior of the logic circuit, such as a calculator or interface circuit is displayed visually. | ||
EDA Linkage | Code | |
STILReader for CX1000Generate files for CX1000 from STIL file | ||
[Discontinued]STILWriter for CX1000Generate STIL file from work project | ||
CATVert-VCD for CX1000Generate files for CX1000 from VCD file and EVCD file | ||
[Discontinued]CATVert-W for CX1000Generate files for CX1000 from WGL file | ||
[Discontinued]LogSynthesis for CX1000 (FastScan)SCAN failure analysis in the Tessent FastScan and ScanFF Map for CX1000 | ||
[Discontinued]LogSynthesis for CX1000 (TetraMAX)LogSynthesis for CX1000 (TetraMAX) | ||
[Discontinued]LogSynthesis for CX1000 (Encounter Test)LogSynthesis for CX1000 (Encounter Test) | ||
[Discontinued]ScanFF Map for CX1000ScanFF Map for CX1000 | ||
External Linkage | Code | |
CT Connect for HandlerCT Connect for Handler is an external linkage IP that connects CloudTesting™ Lab and a test handler. | ||
GPIB Control Tool for ProberGPIB Control Tool for Prober is an external linkage IP that connects CloudTesting™ Lab and the wafer prober. | ||
OperationWindow for CX1000OperationWindow for CX1000 is a utility IP that facilitates operation of CloudTesting(TM) Lab. |