ScanFF Map software is a tool which focuses on failure ScanFF (Scan flip flop) and displays those failures at wafer level. This software can easily grasp the failure occurrence state and also easily detects systematic failures by statistically processing the commonality of failures in record.
Feature
- Multi-wafer display function : Failure trend with each lot can be understood.
- Wafer and Chip display function : Failure trend with each wafer can be understood both at surface and in detail for each scan chain.
- Triage function : Easily detects systematic failures which influence the reduction in yield, by ranking failures by chips, scan chains, and ScanFFs, and by processing those failures statistically.
- Composition function : Combining failed ScanFFs of target wafer and those of target chip detects systematic failures visually.
Purchase Notes
- To install this product, download the installation manual and install it according to the instructions in Installation
- CloudTesting (TM) Lab (R2.21.00 or later) is required.
- Use STILReader for CX1000 IP (R1.01.00 or later)
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Use LogSynthesis for CX1000 IP. There are the following three kinds of LogSynthesis IP.
- LogSynthesis for CX1000 (Encounter Test) IP（R1.00.00 or later)
- LogSynthesis for CX1000 (FastScan) IP（R1.00.00 or later）
- LogSynthesis for CX1000 (TetraMAX) IP（R1.00.00 or later）
