Current and Voltage Measurements for Memory (DCParametricMeasure_Mem_TypeF_IP)

• Fixed an issue that caused measurement to stop when multiple measurements were executed using the WAIT instruction in a pattern program.

1. Support Condition Table Memory_TypeF License(PCXA01-3004) of Functional Testing for Memory(PCXA01-M3001) Rev 1.08.01. (Functional Testing for Memory(PCXA01-M3001) Rev 1.08.01 revision history)

• In Rev 1.07.00, the format of work project has been changed to add functions. Work projects saved with Rev 1.07.00 or later are not backward compatible.

• Support variable setting for Wait Time parameters.
• Support Condition Table Memory_TypeF License(PCXA01-3004) of Functional Testing for Memory(PCXA01-M3001) Rev 1.08.00.

(1) When the measurement target had 1PIN, an error may occur. After improvement, you can measure correctly.
(2) In the Expert Mode, the [Keep Power On] setting in the [Measure Condition] tab and the [Power Keep] setting in the flow item list area are changed synchronously.

Condition Table Memory_TypeF License(PCXA01-3004)

When the WAIT added in Rev 1.06.00 was used and the measurement target had 1PIN, measurement was not performed correctly in the second and subsequent WAIT.
After improvement, you can measure correctly.

Condition Table Memory_TypeF License(PCXA01-3004)

When VIH/VIL is outside the range of the voltage generation or the voltage generation amplitude in [Condition Table], the specification has been changed to generate an error.

• Support “WAIT” which is instruction of “ALPG”.

Support “power-off control” function on “Flow Item List Area” in Expert Mode.