Current and Voltage Measurements for Memory (DCParametricMeasure_Mem_TypeF_IP)

Current and Voltage Measurements for Memory is a algorithm IP to measure current and voltage of I/O pins.

  • Measure current and voltage of I/O pins
  • Execute pattern program before measuring current and voltage
  • Display measurement value on the console
  • Judge measurement value by specified limits

Revision contents on Rev 1.07.02

  • Fixed an issue that caused measurement to stop when multiple measurements were executed using the WAIT instruction in a pattern program.

Features(en)

Current and Voltage Measurements for Memory is a algorithm IP to measure current and voltage of I/O pins.

  • Measure current and voltage of I/O pins
  • Execute pattern program before measuring current and voltage
  • Display measurement value on the console
  • Judge measurement value by specified limits
  • Supports the following licenses.
    • Condition Table Memory_TypeF License(PCXA01-3004). (Manual)
    • High Resolution Timing Memory_TypeF License(PCXA01-3006). (Manual)

Add to Cart

Product GroupAlgorithm IP
CodePCXA01-M3002
Link
ManufacturerADVANTEST CORPORATION
Applicable Equipment
  • CX1000P MEMORY_TYPE_F
  • CX1000D MEMORY_TYPE_F
High Resolution Timing Setting for Memory_TypeF License

Condition Table Memory_TypeF License

Revisions

Released atNumberDescription
June 11, 20241.07.02
  • Fixed an issue that caused measurement to stop when multiple measurements were executed using the WAIT instruction in a pattern program.
April 22, 20211.07.01
  1. Support Condition Table Memory_TypeF License(PCXA01-3004) of Functional Testing for Memory(PCXA01-M3001) Rev 1.08.01. (Functional Testing for Memory(PCXA01-M3001) Rev 1.08.01 revision history)
  • In Rev 1.07.00, the format of work project has been changed to add functions. Work projects saved with Rev 1.07.00 or later are not backward compatible.
April 13, 20211.07.00
  • Support variable setting for Wait Time parameters.
  • Support Condition Table Memory_TypeF License(PCXA01-3004) of Functional Testing for Memory(PCXA01-M3001) Rev 1.08.00.
July 29, 20201.06.03

(1) When the measurement target had 1PIN, an error may occur. After improvement, you can measure correctly.
(2) In the Expert Mode, the [Keep Power On] setting in the [Measure Condition] tab and the [Power Keep] setting in the flow item list area are changed synchronously.

January 09, 20201.06.02

Condition Table Memory_TypeF License(PCXA01-3004)

When the WAIT added in Rev 1.06.00 was used and the measurement target had 1PIN, measurement was not performed correctly in the second and subsequent WAIT.
After improvement, you can measure correctly.

August 28, 20191.06.01

Condition Table Memory_TypeF License(PCXA01-3004)

When VIH/VIL is outside the range of the voltage generation or the voltage generation amplitude in [Condition Table], the specification has been changed to generate an error.

March 04, 20191.06.00
  • Support “WAIT” which is instruction of “ALPG”.
December 06, 20161.05.00

Support “power-off control” function on “Flow Item List Area” in Expert Mode.

Related Post

November 10, 2016
Embedded Technology 2016

CloudTesting™ Service will be demonstrated at our customer’s booth, Embedded Technology 2016.