December 27, 2018 | New Year Holiday 2019Our office will be closed for New Year holidays from 28 Dec. 2018 through 3 Jan. 2019. |
November 30, 2018 | ICCAD 2018We will introduce CloudTesting(TM) Service at ICCAD 2018. |
November 26, 2018 | SEMICON Japan 2018We will introduce CloudTesting(TM) Service at SEMICON Japan. |
November 01, 2018 | electronica 2018We will introduce CloudTesting(TM) Service at electronica 2018. |
October 31, 2018 | New, Robust Pattern Conversion Software for Cloud-Based Semiconductor TestingNew TesterBridge Software Product is Being Demonstrated This Week at International Test Conference in Phoenix. |
October 26, 2018 | ITC 2018We will introduce CloudTesting(TM) Service at International Test Conference (ITC). |
October 25, 2018 | Holiday Closing NoticeOur office will be closed on November 2, 2018. |
October 11, 2018 | Important notification about defect of Capture Range Extension Plugin for Digital Output Capture IP[PCXA01-M1044]This is an announcement on the malfunction arisen in "Capture Range Extension Plugin for Digital Output Capture IP". |
October 11, 2018 | Important notification about defect of Digital Output Capture IP[PCXA01-M1031]This is an announcement on the malfunction arisen in "Digital Output Capture IP". |
October 05, 2018 | Important notification about defect of Generic Search IP[PCXA01-M5005]This is an announcement on the malfunction arisen in “Generic Search IP”. |