News

December 26, 2016
New Year Holiday 2017

Our office will be closed for New Year holiday from 29 Dec. 2016 through 3 Jan. 2017.

December 12, 2016
SEMICON Japan 2016

Cloud Testing Service, Inc. to showcase at SEMICON Japan 2016

November 28, 2016
Important Notification about the Defect of CloudTesting™ Lab unintended power-on

There is a problem on current CloudTesting™ Lab. Uninteded power-on may be performed.

November 10, 2016
Embedded Technology 2016

CloudTesting™ Service will be demonstrated at our customer’s booth, Embedded Technology 2016.

November 09, 2016
System Maintenance Announcement

Due to system maintenance, some CTS services will be unavailable during 2016 December 7th 00:00 - 02:00 GMT

October 04, 2016
Release a Serial NOR Flash Memory Application Package

We released an application package to cut the time needed for starting to evaluate a serial NOR flash memory.

September 20, 2016
Announcement for support services renewal

As of October 1, 2016, We will renew the support service.

September 09, 2016
ITC 2016

Cloud Testing Service Inc. to showcase at International Test Conference 2016.

September 02, 2016
The 25th Asian Test Symposium

Cloud Testing Service Inc. will exhibit panels and products at Asian Test Symposium.

July 28, 2016
Summer Holiday Closing 2016

Office will be closed from August 8, 2016 through August 12, 2016 for summer holiday.