| June 20, 2017 | Important Notification about Defect DC Parametric Measurement IP[PCXA01-M1025]This is an announcement on the “malfunction” arisen in “DC Parametric Measurement IP[PCXA01-M1025]”. |
| June 12, 2017 | International Test Conference (INDIA)- 2017We will introduce CloudTesting(TM) Service at International Test Conference (INDIA)- 2017 (ITC India 2017). |
| May 19, 2017 | NEPCON Thailand 2017We will introduce CloudTesting(TM) Service at NEPCON Thailand 2017 |
| April 26, 2017 | VOICE 2017We will introduce CloudTesting(TM) Service at VOICE 2017. |
| April 24, 2017 | IEEE European Test Symposium 2017(ETS'17)Cloud Testing Service, Inc. will join 22nd IEEE European Test Symposium (ETS). |
| April 18, 2017 | Notice of Golden Week Holidays ClosingOffice will be closed from April 29, 2017 thru May 7 for the Golden Week holiday in Japan. Regular operation will resume on Monday, May 8, 2017. |
| February 21, 2017 | DATE 2017Cloud Testing Service, Inc. will showcase its service overview at DATE 2017. |
| January 27, 2017 | IESA Vision Summit 2017Cloud Testing Service, Inc. will showcase its service overview and online demo at IESA Vision Summit 2017. |
| December 26, 2016 | New Year Holiday 2017Our office will be closed for New Year holiday from 29 Dec. 2016 through 3 Jan. 2017. |
| December 12, 2016 | SEMICON Japan 2016Cloud Testing Service, Inc. to showcase at SEMICON Japan 2016 |
