Program Outline
- Equipment
- CX1000P/D CX1000_MCU
- CTLab
- Rev 2.33.02 or later
- Work Project
- 74HC163rev1.01.02.zip
- Required IPs
- Measuremnet IC
- SN74HC163 [Texas Instruments Incorporated]
- Purpose
- Self-learning for IC Test [Sample Program]
Test Condition
The test conditions of sample program are as follows.
Measure Item Name | Type | VDD | Upper Limit | Lower Limit | Notes |
---|---|---|---|---|---|
Open(-) Test | DC | 0V | -1.2V | Applied Current -100uA | |
Open(+) Test | DC | 0V | 1.2V | Applied Current 100uA | |
Short Test | DC | 0V | 300mV | Applied Current 100uA | |
VCC Short Test | DC | 0.5V | 2uA | -2uA | |
IIL Test | DC | 6.0V | 100nA | -100nA | Applied Voltage 0V |
IIH Test | DC | 6.0V | 100nA | -100nA | Applied Voltage 6V |
Function Test | Function | 6.0V | Verify Function using Pattern | ||
Function Test | Function | 4.5V | Verify Function using Pattern | ||
Function Test | Function | 2.0V | Verify Function using Pattern | ||
Static ICC Test | DC | 6V | 8uA | ||
VIH Test | DC | 6.0V | 4.2V | Binary Serch | |
VIH Test | DC | 4.5V | 3.15V | Binary Serch | |
VIH Test | DC | 2.0V | 1.5V | Binary Serch | |
VIL Test | DC | 6.0V | 1.8V | Binary Serch | |
VIL Test | DC | 4.5V | 1.35V | Binary Serch | |
VIL Test | DC | 2.0V | 0.5V | Binary Serch | |
VOH Test | DC | 6V | 5.9V | Applied Current -20uA | |
VOH Test | DC | 4.5V | 4.4V | Applied Current -20uA | |
VOH Test | DC | 2.0V | 1.9V | Applied Current -20uA | |
VOH Test | DC | 6.0V | 5.48V | Applied Current -5.2mA | |
VOH Test | DC | 4.5V | 3.98V | Applied Current -4mA | |
VOL Test | DC | 6V | 0.1V | Applied Current 20uA | |
VOL Test | DC | 4.5V | 0.1V | Applied Current 20uA | |
VOL Test | DC | 2.0V | 0.1V | Applied Current 20uA | |
VOL Test | DC | 6.0V | 0.26V | Applied Current 5.2mA | |
VOL Test | DC | 4.5V | 0.26V | Applied Current 4mA | |
Delay CLK to Qn | AC | 6.0V | 35ns | Binary Serch | |
Delay CLK to Qn | AC | 4.5V | 41ns | Binary Serch | |
Delay CLK to Qn | AC | 2.0V | 205ns | Binary Serch | |
Delay CLK to RCO | AC | 6.0V | 37ns | Binary Serch | |
Delay CLK to RCO | AC | 4.5V | 43ns | Binary Serch | |
Delay CLK to RCO | AC | 2.0V | 215ns | Binary Serch | |
Delay ENT to RCO | AC | 6.0V | 33ns | Binary Serch | |
Delay ENT to RCO | AC | 4.5V | 39ns | Binary Serch | |
Delay ENT to RCO | AC | 2.0V | 195ns | Binary Serch | |
Setup A-D to CLK | AC | 6.0V | 26ns | Binary Serch | |
Setup A-D to CLK | AC | 4.5V | 30ns | Binary Serch | |
Setup A-D to CLK | AC | 2.0V | 150ns | Binary Serch | |
Setup ENP/ENT to CLK | AC | 6.0V | 29ns | Binary Serch | |
Setup ENP/ENT to CLK | AC | 4.5V | 34ns | Binary Serch | |
Setup ENP/ENT to CLK | AC | 2.0V | 170ns | Binary Serch | |
Setup Load to CLK | AC | 6.0V | 23ns | Binary Serch | |
Setup Load to CLK | AC | 4.5V | 27ns | Binary Serch | |
Setup Load to CLK | AC | 2.0V | 135ns | Binary Serch | |
Setup CLR low to CLK | AC | 6.0V | 27ns | Binary Serch | |
Setup CLR low to CLK | AC | 4.5V | 32ns | Binary Serch | |
Setup CLR low to CLK | AC | 2.0V | 160ns | Binary Serch | |
Setup CLR inactive to CLK | AC | 6.0V | 27ns | Binary Serch | |
Setup CLR inactive to CLK | AC | 4.5V | 32ns | Binary Serch | |
Setup CLR inactive to CLK | AC | 2.0V | 160ns | Binary Serch | |
Hold A-D to CLK | AC | 6.0V | 0ns | Binary Serch | |
Hold A-D to CLK | AC | 4.5V | 0ns | Binary Serch | |
Hold A-D to CLK | AC | 2.0V | 0ns | Binary Serch | |
Hold ENP/ENT to CLK | AC | 6.0V | 0ns | Binary Serch | |
Hold ENP/ENT to CLK | AC | 4.5V | 0ns | Binary Serch | |
Hold ENP/ENT to CLK | AC | 2.0V | 0ns | Binary Serch | |
Hold Load to CLK | AC | 6.0V | 0ns | Binary Serch | |
Hold Load to CLK | AC | 4.5V | 0ns | Binary Serch | |
Hold Load to CLK | AC | 2.0V | 0ns | Binary Serch | |
Fclock Test | AC | 6.0V | 36MHz | Binary Serch | |
Fclock Test | AC | 4.5V | 30MHz | Binary Serch | |
Fclock Test | AC | 2.0V | 6MHz | Binary Serch | |
CLK tw high | AC | 6.0V | 14ns | Binary Serch | |
CLK tw high | AC | 4.5V | 16ns | Binary Serch | |
CLK tw high | AC | 2.0V | 80ns | Binary Serch | |
CLK tw low | AC | 6.0V | 14ns | Binary Serch | |
CLK tw low | AC | 4.5V | 16ns | Binary Serch | |
CLK tw low | AC | 2.0V | 80ns | Binary Serch |
Pin Connection
Pin assignment between IC signal and CX1000P/D is as follows.
Notes:
Connect a 0.1uF capacitor between VCC Pin and GND plate near the IC.
Make the short between GND Signal of IC and ground plane of the test board by the shortest possible line.
For more information of making the test board, refer to CX1000 User’s manual.
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