This document describes MEMORY_TYPE_F firmware of CloudTesting™ Station.
MEMORY_TYPE_F firmware has a functions to measure memory devices. The feature of MEMORY_TYPE_F firmware is the followings:
- Digital Signal Generator of Maximum Frequency 255MHz/533Mbps
- ALPG(ALgorithmic Pattern Generator)
- DC Parametric Measure Unit
- Source Synchronous
- SD Card
- CRC Automatic Calculation
- RCA Information
- Serial Pattern Generation
ALPG is a feature to generate a pattern to test memory cells. The memory cell is tested in a regular pattern, such as marching pattern and checker pattern. In order to generate the pattern efficiently, ALPG can execute the pattern program to calculate the address and data. So, MEMORY_TYPE_F firmware can generate a regular and massive pattern efficiently.
Target Device
The target devices of MEMORY_TYPE_F firmware are the followings:
| Category | Device |
|---|---|
| DRAM | SDRAM, DDR SDRAM, DDR2 SDRAM |
| Flash | NAND, ToggleNAND/ONFI, eMMC, NOR(Parallel), NOR(Serial/SPI) |
| SRAM | Asynchronous SRAM, Aynchronous SRAM, SPI-SRAM |
| SD Card | SDSC, SDHC, SDXC-I, SDXC-II |
| EEPROM | Serial I2C, Serial SPI |
| EPROM | EPROM |
| Next Generation ROM | FRAM(Ferroelectric RAM), MRAM(Magnetoresistive RAM), PCM/PRAM(Phase Change Random Access Memory), ReRAM(Resistance RAM) |
Measurement Channel
The measurement channels which is available in MEMORY_TYPE_F firmware are the followings:
| Measurement Channel | CX1000P | CX1000D |
|---|---|---|
| I/O | 32 | 128 |
| Power Supply | 2 | 8 |
| Reference Voltage Supply | 2 | 8 |