In Functional Testing IP, fail pins are not displayed in the data log even though the test result is Fail as shown below.
What the reason for that?
Is the test condition set as follows?
- In [Signal] tab, pins not described in the main pattern are set to [Mode] = [Out].
The pins which have been set some signal conditions but have not been programed in main pattern behave as being programed WFC0 while the pattern is running. For more information, refer to “Relation between a Signal Condition and a Pattern” of “Setting Signal Conditions”. When these pins are set to [Mode] = [Out], they operate as comparators and compare L (WFC0) at all addresses during pattern execution. Fail cycle of data log for pins not described in the main pattern are not displayed. Therefore, if a Fail occurs at pins not described in the main pattern, the Fail pin will not be output to the fail cycle log, but the test result will be Fail.
It can be solved by any of the following methods.
- Set [Mode] = [Open] for pins that are not compared.
- Describe all pins to the main pattern.
- Pins that do not need to be compared set to [Mask pins] In [Pattern] tab.