In general, following test items are required for DRAM testing.
Contact Test
Tests a contact between IC and socket.
Current and Voltage Measurements for MemoryIP is suitable for this test item.
Current and Voltage Measurements for MemoryIP is an algorithm IP to measure current and voltage of signal pins.
Pattern program can be executed prior to measuring current and voltage. And pass/fail judgement is available by setting up limit value of the test item.
Leak Current Test
Measures leak current of input pins and IO pins of IC.
Current and Voltage Measurements for MemoryIP is suitable for this test item.
Function Test
Checks if memory cells operate correctly by writing and reading memory cells.
Functional Testing for MemoryIP is suitable for this test item. Functional Testing for MemoryIP can select signal timing of each signal pin, voltage setting, power supply voltage setting and pattern program.
If test fails, output detailed information of the fail such as failed IO and address. Also this IP can be used for check the margin of the IC by changing frequency and power supply voltage.
Power Supply Current Measurement
Measures and test power supply current under specified conditions.
Power Supply Current Measurement for MemoryIP is suitable for this test item.
Power Supply Current Measurement for MemoryIP runs pattern program and measures power supply current under specified condition such as stand-by and operating state. And pass/fail judgement is available by setting up limit value of the test item.
Bump Test
Runs function test with changing power supply voltage on one pattern program.
This test can be done using Functional Testing for MemoryIP and Condition Table Memory_TypeF License.
Also it is possible to run this test with changing power supply voltage at writing data to the device and at reading data from the device.
AC Test - 2 Dimensional Shmoo
Runs function test with changing specified parameter. Shmoo plot can be obtained automatically by using Shmoo Plot Tool for Memory.
Defective Cell Analysis - Fail Bit Map Analysis
Displays defective cells in a fail bit map view. This analysis can be done using Functional Testing for MemoryIP and Fail Bit Map Tool for Memory
Fail Bit Map Tool for Memory displayes results of function tests in 2 dimensional map. Physical location of each cells are displayed in the map as physical location can be defined by user.
And Fail Bit Map Tool for Memory works without CloudTesting™ Station. So fail bit map analysis can be done even if CloudTesting™ Station is used for another test and measurement.
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