Output Raw Fail Address for Memory_TypeF License

[Output Raw Fail Address for Memory_TypeF License] can add a function to [Functional Testing for Memory(PCXA01-M3001)] and save Fail Address Data to a file.
This function is used for failure analysis purposes.
Concrete use case

  • Fail bit address analysis of IC memory.
  • Read ID of IC memor.
  • DRAM: Distribution analysis of refresh time and precharge time.
  • Flash Memory: Distribution analysis of Vth.

Revision contents on Rev 1.03.00

The revision history was integrated into Functional Testing for Memory(PCXA01-M3001)

Please refer to Revision Hisotry of Functional Testing for Memory(PCXA01-3001).

Features

  • Save Fail Address data to file(binary data).
  • Display Fail Address counts.
  • Set address area for Fail Address count.
  • Set “Fail Addres Counts” to user variable, that variable are Integer or Integer array.
  • It controls the output of the fail address count to the message display area.
  • Please refer to the manual from “Features” of Functional Testing for Memory(PCXA01-3001).

Pcxa01 m3005

Add to Cart

Require Sign In

Require Sign In

Product GroupAlgorithm IP
CodePCXA01-M3005
ManufacturerADVANTEST CORPORATION
Applicable Equipment
  • CX1000P MEMORY_TYPE_F
  • CX1000D MEMORY_TYPE_F
Small pcxa01 m3001
Functional Testing for Memory

Revisions

Released atNumberDescription
November 21, 20171.03.00

The revision history was integrated into Functional Testing for Memory(PCXA01-M3001) .

December 06, 20161.02.00

Add to set area function of fail address counter. Additional items in Functional Testing for Memory(PCXA01-M3001) Rev 1.06.00.

November 30, 20161.00.00

First release

Related Post

November 10, 2016
Embedded Technology 2016

CloudTesting™ Service will be demonstrated at our customer’s booth, Embedded Technology 2016.